Optical and structural properties measurements of material(s)/compounds in Extreme Ultraviolet Spectral Range
|Extreme ultraviolet optics are based on optical coatings made of thin films and multilayer structures (ML). The performance depends on the design and selected materials. A good and reliable knowledge of the optical properties of materials in the EUV is fundamental, since available theoretical data are not enough to predict accurately the throughputs. The aim of the thesis is to characterize the optical constants of element(s), not yet well known in EUV spectral band, applying different diagnostic techniques, based on reflection and absorption measurements, taking into account the polarization of radiation. Suitable composite structures will be grown in order to emphasize the effect due to the coupling of different materials like stress and interface characteristics.|
|Example: Optical constants of thin layer of MoS2 are well known in the range of 0.7 to 40nm but not yet well studied for wavelength range 40-160 nm. Following is some comparison of the reflectance spectra of MoS2/SiO2/Si and SiO2/Si at wavelength 40nm obtained by IMD simulation tool.|
Mr. Nadeem Ahmed graduated from the Quaid- I – Azam University (QAU), Islamabad Pakistan in Physics. On the basis of this degree he won Govt. scholarship for master studies after countrywide competition. He completed his Master of Philosophy (M. Phil) in Physics from Pakistan Institute of Engineering and Applied Sciences (PIEAS), Islamabad, Pakistan. During his M. Phil research, He worked on Synthesis and characterization of ZnO thin films by reactive electron beam evaporation and pulsed laser deposition techniques. His thesis was mainly on the growth of ZnO thin films and effect of post deposition thermal annealing on structural and optical properties of ZnO thin films. He also worked on Synthesis and characterization of crystalline SiC thin films by RF reactive magnetron sputtering. He published two research articles in international journals and one in a conference based on his M. Phil research. After completing his Master studies, he joined academic research and actively involved in semiconductor (II-VI & III-V) characterization (Structural, Optical & Electrical) by using SEM, EDX, Surface Profileometer, FTIR, Spectrophotometer, CV-IV measurement setup etc. He has joined EXTATIC Erasmus Mundus Joint Doctorate program on October 2016.